Reference: Lab Experiments Journal vol-11, No.1, Page-1 Lab Experiments Journal vol-10, No.4, Page-316

Four probe apparatus

Experiment(s):

Resistivity variation with temperature for a semiconductor sample

Determination of energy gap of a semiconductor sample

Specifications

1 . Resistivity of semiconductor by four probe kit

                    Voltmeter: 0-200 mV
Resolution: 0.1 mV
Ammeter: 0-20 mA
Resolution: 0.01 mA
Source: Built-in constant  current source with variable output current setting Internally connected voltmeter and current meters
Rated Input: 220 V/50 Hz or 110 V/60 Hz
Power Consumption: <200 W

Digital thermostat
Resolution: 0.1 °C
Max temperature: 110 °C
Set temperature: with-in +1 °C
                  

2 . Four probe arrangement

                    Crystal: Mounted on heating element (electrically insulated)
Sample: Germanium
Size: 10 mm x 5 mm x 1 mm
Pitch of each probe: 2 mm
Heater: 100 W
                  

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