Reference: Lab Experiments Journal vol-11, No.1, Page-1 Lab Experiments Journal vol-10, No.4, Page-316
Four probe apparatus
Model: FP-1911
Experiment(s):
Resistivity variation with temperature for a semiconductor sample
Determination of energy gap of a semiconductor sample
Specifications
1. Resistivity of semiconductor by four probe kit
Voltmeter: 0-200 mV Resolution: 0.1 mV Ammeter: 0-20 mA Resolution: 0.01 mA Source: Built-in constant current source with variable output current setting Internally connected voltmeter and current meters Rated Input: 220 V/50 Hz or 110 V/60 Hz Power Consumption: <200 W Digital thermostat Resolution: 0.1 °C Max temperature: 110 °C Set temperature: with-in +1 °C
2. Four probe arrangement
Crystal: Mounted on heating element (electrically insulated) Sample: Germanium Size: 10 mm x 5 mm x 1 mm Pitch of each probe: 2 mm Heater: 100 W